UHR TEM - Ultra High Reslution Transmission Electron Microscope JEM-2100Plus
Special methods
JEOL
- multi purpose transmission electron microscope for micro structure evaluation, which combines the proven JEM-2100 optic system with an advanced control system for enhanced ease of operation
- maximum accelerating voltage - 200kV
- guaranteed resolution - 0.14 nm (TEM lattice image)
- magnification - x30 to x800 000
Contact Person
Kalbáč Martin